Automated measurement system for diode I-V characterization

N.S.M. Saufi

QR Code Link :
Type :	article
Subject :	L Education (General)
Main Author :	N.S.M. Saufi
Additional Authors :	N.S.Y. Abdullah Mohd Ikhwan Hadi Yaacob
Title :	Automated measurement system for diode I-V characterization

Year of Publication :

2017

Abstract :

This paper presents the development of easy-to-operate automated measurement system capable in obtaining I-V characteristics of diode. Characterization and testing of semiconductor device using data acquisition system can become easier than conventional method as lot of testing during research is needed to examine the performance of diode. Therefore an easy and yet efficient measurement system is needed to accomplish the necessity. The proposed system comprises of Phidget Interface Kit 8/8/8 which is used to acquire voltage and current measures from Phidget voltage sensors and sending it through USB (Universal Serial Bus) to personal computer (PC). LabVIEW used as the PC graphical interface to control data acquisition, display voltage and current value and to analyze the data. Current-voltage (I-V) characteristics of silicon rectifier diode and Schottky diode and the knee voltage for each diode have been determined. The measured knee voltage for silicon diode is 0.6 volts and for Schottky diode is 0.3 volts which are close to the theoretical values. The proposed system also capable in characterizes any two terminals devices such as resistor, transistor and integrated circuits.

References

1. Travis, J., Kring, J. (2006) LabVIEW for Everyone: Graphical Programming Made Easy and Fun. Cited 321 times. 3rd edition Prentice Hall 2. Wen, H., Ma, J., Zhang, M., Ma, G. The comparison research of nonlinear curve fitting in matlab and LabVIEW (2012) Proceedings - 2012 IEEE Symposium on Electrical and Electronics Engineering, EEESYM 2012, art. no. 6258591, pp. 74-77. Cited 8 times. ISBN: 978-146732365-9 doi: 10.1109/EEESym.2012.6258591 3. Elliott, C., Vijayakumar, V., Zink, W., Hansen, R. National Instruments LabVIEW: A Programming Environment for Laboratory Automation and Measurement (Open Access) (2007) Journal of Laboratory Automation, 12 (1), pp. 17-24. Cited 145 times. doi: 10.1016/j.jala.2006.07.012 4. Azooz, A. Analog data acquisition for obtaining I-V characteristics using sound cards (2006) Computing in Science and Engineering, 8 (4), art. no. 1644701, pp. 10-15. Cited 5 times. doi: 10.1109/MCSE.2006.60 5. Noriega, J.R., Vera-Marquina, A., Acosta Enriquez, C. Automation of an i-v characterization (2010) Journal of Applied Research and Technology, 8 (2), pp. 1-26. 6. Patel, P.K., Kheraj, V.A., Panchal, C.J., Desai, M.S., Vakil, P.D., Patel, K.J. Automated measurements of junction characteristics to evaluate parameters for semiconductor diodes (2009) Indian Journal of Pure and Applied Physics, 47 (7), pp. 517-522. 7. Bakshi, A.G.U. (2009) Basic Electronics. Cited 4 times. Technical Publication

This material may be protected under Copyright Act which governs the making of photocopies or reproductions of copyrighted materials.
You may use the digitized material for private study, scholarship, or research.

Back to previous page