Photothermally induced vibration of an optically driven atomic force microscope

Shahrul Kadri Ayop

QR Code Link :
Type :	Thesis
Subject :	QC Physics
Main Author :	Shahrul Kadri Ayop
Title :	Photothermally induced vibration of an optically driven atomic force microscope
Hits :	2

Place of Production :	Tanjong Malim
Publisher :	Fakulti Sains dan Matematik
Year of Publication :	2011
Corporate Name :	Perpustakaan Tuanku Bainun
PDF Guest :	Click to view PDF file
PDF Full Text :	You have no permission to view this item.

Abstract : Perpustakaan Tuanku Bainun

The first working atomic force microscopy (AFM) was demonstrated in 1986 by G. Binnig, C.F. Quate, and Ch. Gerber (1). The invention was based on its predecessor, a scanning tunneling microscope (STM), which led to the recognition award of the Novel Prize (Physics) in 1986 (2). The STM operation lies on the electron tunneling effect trough the potential barrier between electrically conductive probe and sample surface. Meanwhile, force interaction (e.g. van der Walls forces, electrostatic forces, magnetic forces) between sample surface and probe is the operation principle for AFM. Compared to the STM, samples studied under the AFM do not need to be electrically conductive or metal-coated. The AFM invention solves the problem to image a surface beyond the diffraction limit (resolution in nm order) of common optical microscopy in both electrically conductive and non-conductive samples, as well as in various condition of sample environment (e.g. liquid). Since the invention of the STM and AFM, various probe based-microscopes have been developed, for example friction force microscope (FFM) and near-field scanning optical microscope (NSOM). These kinds of microscopes are grouped under the family of scanning probe microscope (5PM).

This material may be protected under Copyright Act which governs the making of photocopies or reproductions of copyrighted materials.
You may use the digitized material for private study, scholarship, or research.

Back to search page