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Dielectric behavior in erbium-doped tellurite glass for potential high-energy capacitor

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General Information
Title
Dielectric behavior in erbium-doped tellurite glass for potential high-energy capacitor
Type
Article
Main Author
Muhammad Noorazlan Abd Azis
Additional Authors
  • Halimah Mohamed Kamari
  • M. K. Halimah
  • A. B. Suriani
Subject
Q Science (General)
Language Code
eng
Bibliographic Details
Place of Production
Tanjong Malim
Publisher
Fakulti Sains dan Matematik
Year of publication
2019
Degree Type
Not related
Corporate Name
Universiti Pendidikan Sultan Idris

Abstract

The use of erbium ions, Er3+ to enhance the dielectric properties is investigated in tellurite glass system for the frst time, tothe best of our knowledge. A glass series of tellurite glass with chemical composition, {[(TeO2)70(B2O3)30]70(ZnO)30}100−y(Er2O3)y (y = 0, 0.005, 0.01, 0.02, 0.03, 0.04 and 0.05) was fabricated via melt-quenched technique. The X-ray difraction and Fourier transform infrared spectroscopy analysis proved the amorphous structure and the formation of nonbridging oxygen in the glass system. The Er3+ ions afect greatly to the dielectric constant, ε′ in which the dielectric constant, ε′ show high value at a lower frequency and higher temperature (above 110 °C). The reduction of dielectric constant, ε′ is found with the increment value of frequency, which corresponds to the formation of the hindrance efect on heavy dipoles caused by the mixed transition-ion efect. Meanwhile, the dielectric constant, ε′ is enhanced with the increase of temperature. The activation energy of the glass system is found to decrease, which is due to the high polarizability of Er3+ ions in the glass system. Based on these results, the erbium-doped tellurite glass is a potential kind of high-energy capacitor.

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