This study investigates the potential of Sulfocalix[4]arene (SC[4]) thin film for the removal and molecular-level adsorption of Rhodamine B dye (RhB), focusing on its performance in extraction and adherence. SC[4] thin films with 5, 10, 15, and 20 layers were fabricated using the spin coating method and subsequently characterised for its optical and topographical properties. Optical characterisation using Ultraviolet-Visible Spectroscopy (UV-Vis) at wavelengths from 260 to 300 nm revealed a progressive increase in absorbance across layers, notably at 277 nm and 283 nm peaks. Topographical analysis was conducted using Atomic Force Microscopy (AFM) to determine thickness and surface roughness. Results indicated a linear correlation between film thickness and the number of layers, with measurements of 58.175 nm for 5 layers, 77.626 nm for 10 layers, 84.608 nm for 15 layers, and 94.806 nm for 20 layers. Surface roughness, quantified via root mean square roughness (Rq), was significantly in.....

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This study aims to characterise 4-Sulfocalix[4]arene (SC[4]) thin films using Atomic Force Microscopy (AFM) in analysing its thickness and surface morphology. Quartz substrates were cleaned using ultrasonic cleaning with an Elmasonic P70H. SC[4] thin films were then fabricated on a quartz surface using WS-400BZ-6NPP/A1/AR1 model spin coater from Laurel Technologies, producing thin films with 5, 10, 15, and 20 layers. Each thin film was characterised in the tapping mode of the AFM Park System NX-10. Scans were conducted on different film areas of different scales, and the data were analysed using XEI Data Processing and Analysis Software. Height measurements obtained via Line Profile analysis revealed a progressive increase in film thickness with the additional layers, demonstrating a significant linear relationship. AFM images showed precise 2D and 3D surface topography, indicating that the thin films became uneven and non-uniform with the addition of more layers. The findings demonstr.....

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